HUSSAIN, Sabir. Low power and high fault coverage SIC reseeding TPG using x-filling techniques for Scan BIST. International Journal of Engineering and Technology, [S. l.], v. 7, n. 1.2, p. 220–224, 2017. DOI: 10.14419/ijet.v7i1.2.9232. Disponível em: https://mail.sciencepubco.com/index.php/IJET/article/view/9232.. Acesso em: 18 aug. 2025.